MAPAN — Journal of Metrology Society of India
VOLUME CONTENTS
Volume - 22
Number 1: January - March 2007
| Preface | 143 |
|
A Technical Approach to Establish Traceability in Materials
Metrology Gun-Woong Bahng, Seong-Jai Cho and Hae Moo Lee |
145 |
|
Quantitative Challenges in Characterising the Mechanical Properties
of Hard Materials Roger Morrell and Bryan Roebuck |
153 |
|
A 3D-Calibration Method for the Quantitative SPM Measurement of
Hardness Indenters Martin Ritter, Thorsten Dziomba, Matthias Hemmleb, Ludger Koenders and Axel Kranzmann |
167 |
|
Metrological Aspects of Electron Backscattering Diffraction in
Characterising Hot Deformation Grain Structures K.P. Mingard, B. Roebuck, E.G. Bennett, M. Thomas, B.P. Wynne and E.J. Palmiere |
177 |
|
Nanometrology: an Issue of Scale
Stephen M. Hsu |
201 |
|
VAMAS Promotes Metrology of Material Property Measurement at CIPM
Graham Sims and Seton Bennett |
209 |
| Fifty second List of Fellows and Corporate Member | 221 |
| Instructions to Contributors | 222 |