Vijay Narain Ojha was born in Ajmer on 9th September, 1958. He received his B.Sc. and M.Sc. (Physics)  degrees from Rajasthan University in 1977 and 1979 respectively.  In 1981 and 1987 he did his M. Phil. and Ph. D. (Physics) from Delhi University.  Since November 1982 he is working as a Scientist in the National Physical Laboratory, India. Presently he is Head, JVS & DC standards (Division of Electrical & Electronics Standards). He has to his credit more than 130 research papers in the various international, national journals and conferences in the fields of semiconductors, superconductors and their related devices and also in the field of metrology and Quality System (ISO-25/17025).  Some of them are well cited by the other workers in the field.

He has edited seven books and has been the convenor of national and international conferences in the field of metrology.

Recently we have received a project entitled: Generic development of nanometrology for nanotechnology at NPL (I)” from ministry of communication and information technology, Government of India, budget Rs. 14.0 Crore.  As a principle investigator I am co-ordinating this project and the aim of the project to set up for the first time in India the nanometrology lab to establish some parameters in the field of nanoelectrical and nanodimensional metrology traceable to SI unit..

He has received honours and awards namely:

(i). 'Merit Scroll of A.N. Chatterjee Memorial Award' for outstanding work of 1990 in "High Tc SQUID".

(ii). He is the recipient of 'CSIR Young Scientist Award' from President of India in Physical Sciences in 1992 for his contribution "In high Tc SQUID and for fabrication of new generation Josephson series array Voltage Standard."

(iii). He is the 'Young Scientist Awardee' of the URSI in 1993 and presented the paper entitled “ Fabrication of NbAl2O3Nb Josephson series arrays for voltage standards and switches”, in Kyoto, Japan under commonwealth fellowship to attend the international conference.

(iv). In 1996, 'MSI Young Scientist Award' for the research paper.

(v). Received “Outstanding TEAM AWARD for 2003-2004 of NPL” for successfully completing the international peer of CMC under BIPM -MRA. The calibration certificates are now globally accepted.

(vi). He was the recipient of DAAD Fellow at PTB, Germany (1990-1992) for 2 years and worked extensively in the field of the fabrication of NbAl2O3Nb Josephson series arrays and precision measurement of the Josephson voltage standard and switches.

 

He has been the guest worker at CSIRO, Sydney, Australia; ETL, Tsukuba, Japan; Fluke, Singapore; Fluke, Norwich, U.K.; NPL, U.K.; and PTB, Germany.

He has delivered more than thirty (30) invited talks in various organisations (private and government) and in conferences, namely at IIT, Kanpur; C-Dot; Delhi University (South Campus), CETE, Noida; NPL; CII - NEMA Meet; ETL, JAPAN; Bratislava, Slovak Republic, NIST, USA in the field of microwaves and lightwaves, semiconductors and superconductors, quality and calibrations.

He has given more than fifty talks on uncertainty in measurements in various industries all over India under NABL, NPL etc. workshops and training courses at NPL, IIQM, and Jaipur etc.

He is Fellow of ‘Metrology Society of India’. Life member of  ‘Indian Cryogenic Council’ ‘Material Society of India’; ‘Indian Society of Analytical Scientist’, ‘Indian Science Congress’, ‘Semiconductors society of India’.  URSI Correspondent for the year 1990-1993.

He is: Core committee member of  NABL-141 document on uncertainty published by DST .

One of the members of NABL Electrotechnical Committee for Calibration Laboratories.

One of the members of the ‘Basic Electrotechnical Standards Sectional Committee’ of ‘Bureau of Indian Standards’ (BIS).

One of the members of the ‘Nanotechnologies Sectional Committee, MTD 33’ of ‘Bureau of Indian Standards’ (BIS)